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Jackowska, R; Courtier, N E; Chen, Y; Planden, B; Howey, D; Lopez, C; Spathara, D; Kendrick, E (2026) Transport limitations in single-crystal NCM cathode electrodes. Journal of Power Sources, 663. 238881 ISSN 03787753

K

Kim, D; Wood, S; Castro, F A (2026) Quantitative Kelvin Probe Force Microscopy (KPFM). Measurement Good Practice Guide. 155

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Samajdar, R N; Zhou, Y; Rodriguez, O; Lazumi, J; Vuriti, N; Clark, T; Winter, M; Nowak, S; Risse, S; Gilmore, I S; Wain, A J (2026) Designing Realistic Operando Raman Battery Experiments: Examining Measurement Validity and Spatial Inhomogeneities. Chemistry of Materials, 38 (2). pp. 782-790. ISSN 0897-4756

Sari, A; Feng, D; Brown, M; Trilk, J; Shang, X; Ausden, L; Naftaly, M; Ridler, N M; Gunn, J M F; Constantinou, C; Hales, J; Premerlani, R; Navarro-Cía, M (2026) Interlaboratory mmWave and THz Quasi-Optical Characterization of Commercial Conventional and 3-D Printable Substrates. IEEE Transactions on Terahertz Science and Technology, 16 (6). pp. 737-749. ISSN 2156-342X

Shin, Sang-Hee; Lucyszyn, Stepan; Ridler, N M (2026) Simulation-Based Calibration Verification for (Sub-)Terahertz S -Parameter Measurements. IEEE Transactions on Instrumentation and Measurement, 75. 8001405 ISSN 0018-9456

Skinner, J; Stokes, D; Manning, L; Celep, M (2026) Assessment of VNA Frequency Extender Linearity by Attenuation Build-Up Method. In: 2026 106th ARFTG Microwave Measurement Conference (ARFTG), 18-21 Janaury 2026, Los Angeles, CA, USA.

T

Tong, Vivian; Jones, C; Roebuck, B; Walsh, M; Alm, P; Olovsjö, S; M'Saoubi, R; Mingard, K (2026) Quantification of plastic deformation in hardmetal tool inserts at the macroscopic and microstructural level. International Journal of Refractory Metals and Hard Materials, 139. 107770 ISSN 02634368